Description:

Dr. Xiaofeng Zhang
Hitachi High Technologies America

Biographical Sketch
Xiao Feng Zhang received his Ph. D degree in 1994 from University of Antwerp/Belgium. He worked in Argonne National Laboratory as a postdoctoral research associate till 1997, and then received a Director-Fund Fellowship from Los Alamos National Laboratory. From late 1998 to 2006, he took a staff scientist position in Lawrence Berkeley National Laboratory. Currently, he works in Hitachi High Technologies America as a senior electron microscope product development manager.

Abstract
This presentation will start with an introduction of Hitachi’s state-of-the-art 300 kV H-9500 transmission electron microscope which can serve as a workhorse for routine material structural characterization. Emphasis will then be given to development of a gas environmental TEM (ETEM) capability enabled by differentially-pumped evacuation system and gas injection port on TEM column. Gas can be injected directly to specimen chamber. This technology overcomes the limitation of using the window-type environmental-cell holders and therefore triples the research work that can be done on one microscope. Materials can be characterized as is, under external stimulation, or being stimulated while surrounded by gas. Lab-In-Gap type of TEM study becomes reality with a combination of ETEM and specially designed sample holders. Examples will be given for recent progresses in gas environmental in situ TEM applications.

REFRESHMENTS WILL BE PROVIDED